Ionic Contamination Tester
Ionic Contamination Tester
Ionic Contamination Tester

IONIC CONTAMINATION TESTER,PCB CONTAMINATION TESTER

NCT:Neo Cleanliness Tester

Neo Cleanliness Tester

Neo Cleanliness Tester,also named as ionic contamination tester,

is a device used to measure the level of ionic contamination on a surface. It is typically used to test the cleanliness of electronic components and devices, such as printed circuit boards (PCBs), to ensure that they are free from ionic contamination that could interfere with their proper functioning.

Ionic contamination testers work by measuring the conductivity of a surface, which is a measure of the ability of the surface to allow an electrical current to flow through it. Ionic contamination on a surface can increase its conductivity by leaving a residue of charged particles, which can interfere with the normal flow of current in electronic components and devices. Ionic contamination testers can detect these charged particles and provide a measure of their concentration, which can be used to determine the level of ionic contamination on a surface

Dynamic vs. Static

Since the birth of ionic contamination tester, there has been some argument over the so-called dynamic or static testing methods. Both sides claim they could deliver more benefits than the other. To overcome these issues, Noetel cleanliness tester gives you the flexibility to adopt the method whatever you prefer as both are cited by IPC standards. This is especially important for OEM manufacturers; their various customers may require different methods of analysis, and this saves the purchasing of the two types of equipment

What is ionic contamination

Ionic contamination is the presence of ions (atoms or molecules that have a positive or negative charge due to the loss or gain of electrons) on the surface of an object that can interfere with the proper functioning of electronic devices or systems. It can occur when ions from the environment, such as dust, moisture, or pollutants, come into contact with the surface of the object and leave a residue of charged particles. Ionic contamination can cause problems in electronics and electrical systems by disrupting the normal flow of current, causing short circuits, or interfering with the proper operation of sensitive components. It is important to keep electronic devices and systems clean and free from ionic contamination to ensure their proper functioning. This can be achieved through the use of cleaning agents and protective coatings, as well as proper handling and storage practices.

Why ionic contamination testing

it is typically due to the presence of ions in the environment that come into contact with the surface of the PCB. These ions can be introduced through a variety of sources, including dust, moisture, or pollutants in the air, and can leave a residue of charged particles on the surface of the PCB.

Ionic contamination can cause problems in electronics and electrical systems by disrupting the normal flow of current, causing short circuits, or interfering with the proper operation of sensitive components. It is important to keep electronic devices and systems clean and free from ionic contamination to ensure their proper functioning. This can be achieved through the use of cleaning agents and protective coatings, as well as proper handling and storage practices.

Why PCB cleaning

The main goal of cleaning is to remove flux and resin residue from PCBs that are populated. The vast majority of PCB assemblies in the aerospace, automotive, military, and telecommunications industries will require assemblies that are devoid of harmful contaminants.In fact, PCBs that are contaminate-free are considered mandatory for the next manufacturing stage, which may consist of conformal coating, epoxy shaking, or underfill. Flux residue that is left to sit on the assembly will cause delamination and/or poor wetting. As an added benefit, the PCBs will also appear more aesthetically pleasing after they have been cleaned.

Testing Standards

The ionic contamination level is calculated from the ionic conductivity of the solution which cleans the PCB. The result is an average value across the whole surface. Cleanliness testing is now a routine procedure and manufacturers of both bare and populated boards. They are commonly asked to have an ionic contamination tester to ensure their process.

IPC-TM-650 2.3.28

This ionic contamination testing method involves a thermal extraction similar to the modified ROSE test. After thermal extraction, the solution is tested using various standards in an ion chromatograph tester. The results indicate the individual ionic species present and the level of each ion species per square inch.

Why NaCl

The NaCl equivalence refers to the amount or concentration of sodium chloride (salt) needed to produce a solution of the same conductivity. It has nothing to do with the amount of elemental sodium or chloride found in the test solution. NaCl equivalence is a factor used to compare the results from one ionic tester to another.

Modified ROSE

The modified ROSE test method involves a thermal extraction. The PCB is exposed in a solvent solution at an elevated temperature for a specified time period. This process draws the ions present on the PCB into the solvent solution. The solution is tested using an Ionograph-style test unit. The results are reported as bulk ions present on the PCB per square inch

IPC-TM-650 2.3.25

IPC-TM-650 2.3.25: Resistivity of Solvent Extract (ROSE) Test Method. The ROSE test method is used as a process control tool to detect the presence of ionic contamination. The IPC limit is set at 1.56 μg/NaCl/cm.sq. The tester should be realized by an ionic testing unit, it does not identify specific ions present. This process draws the ions present on the PCB/PCBA into the testing solution. The results are reported as the total ions present on the PCB per square inch/cm.

Testing MethodIPC TM-650 REFERENCE
Ion ChromatographyIPC TM 650 2.3.28
SIR testing for materials and finished assembliesIPC TM 650 2.6.3
IPC TM 650 2.6.3.1
IPC TM 650 2.6.3.2
IPC TM 650 2.6.3.3
Electromigration TestIPC TM 650 2.6.14
IPC TM 650 2.6.14.1
Bellcore SIR TestGR 78 Chapter 13.1
Bellcore Electromigration TestGR 78 Chapter 13.1
Bellcore Fabricator SIRBellcore Chapter 14.4
BIC  (R.O.S.E. Testing)IPC TM 650 2.3.25
BIC (Modified  R.O.S.E. Testing)IPC TM 650 2.3.25.1
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